imc DataWorks specializes in multi-parameter, mixed-signal mechanical data
acquisition, measurement, and control. This includes testing and validation of the Mechanical,
Electromechanical and Mechatronic properties common to most manufacturing, QC/QA,
and R&D Test Stands, Test Cells, and benchtop tests.
While this covers a lot of ground, there are key requirements to all Test Stands we are
involved in
| 
| 
|
| Benchtop: Portable, Reconfigurable
| Test Stand: Self Contained, Open/Closed Loop Control
| Test Cell: Processing for Integration with other systems
|
- Compact
- Reconfigurable
- Universal Amplifiers: Voltage, Strain, Current, Pressure, IEPE/ICP, Temperature, ...
- DSP for easy-to-use calculated channels & control signals
- Self Contained: Test Stand in a Box
- 8 - 16 differential analog inputs
- Discrete Digital Inputs / Digital Outputs
- Encoder / Pulse / Counter / PWM inputs
- Analog outputs
- CANBus I/O
- Removeable Flash Storage Card
- Start & Control from display panel -- PC is optional!
|
- Shelf, Bench, or Rack mount
- TEDS Support: Plug & Play sensors
- Ready-to-use software: no programming required
- Online Realtime DSP control
- Open / Closed Loop Control; 8 x 100 us PID loop
- Live calculation & Display
- Manual, Semi-Automated, or Fully Automated testing
- Data storage: PC, Network, and/or flash
- Standalone operation, PC optional
|
- Rack or Chassis/Boom mounted modular systems
- Support CANBus and other FieldBus communication
- Flexible Software Interface
- Ready-to-use standard configuration & operation software
- System development / Custom GUI
- Centralized, Distributed, or Hybrid topologies for 1000's of channels
- Less cabling: integrated signal conditioning, TEDS, Sensor supply
|
|
Customer Profile
Class Counting in Gear Box Testing
For its newly equipped automatic test rigs, Ford has chosen
imc technology to acquire and evaluate gear box life cycle data. From
the ten acquisition channels, real time calculations are used to
create up to 64 class counting matricies during the test run.
Application Overview |
Continued >>
| |
|
|
Data Acquisition 
Instrument Setup
System Features
Visualization & Analysis
Documentation & I/O
More Info
